An analysis of fault partitioned parallel test generation
نویسندگان
چکیده
منابع مشابه
An analysis of fault partitioned parallel test generation
Generation of test vectors for the VLSI devices used in contemporary digital systems is becoming much more difficult as these devices increase in size and complexity. Automatic Test Pattern Generation (ATPG) techniques are commonly used to generate these tests. Since ATPG is an NP complete problem with complexity exponential to circuit size, the application of parallel processing techniques to ...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 1996
ISSN: 0278-0070
DOI: 10.1109/43.506139